Data for AI 2020 Conference
Data for AI Week: Virtual Conference Experience - Addressing the Data Side of AI in a Conference Unlike any Other
Data for AI 2020 Conference
Presented by:
Appen

Appen collects and labels images, text, speech, audio, video, and other data used to build and continuously improve the world’s most innovative arti­ficial intelligence systems.

About this Session

Bias in machine learning is a significant concern as technology gets increasingly ubiquitous across many industries. Some types of bias can be attributed to limits in design and tooling; however, the bias in the training data itself is a general phenomenon. Skewed training data propagates into discriminatory AI models that amplify human prejudices.

Building a data labeling framework that uses a diverse set of crowd workers to collect and label the data can help reduce bias.

Featured Presenters

Meeta Dash

VP of Product at Appen As VP Product at Appen Meeta is building a machine learning data annotation platform focused on Computer Vision, Autonomous Vehicles,

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